Download An Introduction to Mixed-Signal IC Test and Measurement by Gordon Roberts, Friedrich Taenzler, Mark Burns PDF

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By Gordon Roberts, Friedrich Taenzler, Mark Burns

With the proliferation of complicated semiconductor units containing electronic, analog, mixed-signal, and radio-frequency circuits, contemporary engineer needs to be fluent in all 4 circuit varieties. Written for complicated undergraduate and graduate-level scholars, in addition to engineering pros, An Introduction to Mixed-Signal IC try and Measurement, moment variation, encompasses analog, mixed-signal and radio-frequency circuits checks, with many correct business examples. The textual content assumes a pretty good history in analog and electronic circuits and a operating wisdom of pcs and laptop programming.

An creation to Mixed-Signal IC try and Measurement, moment version, comprises examples and illustrations--featuring cutting-edge commercial technology--to enhance and brighten up the textual content. The booklet additionally introduces large-scale mixed-signal circuit and person circuit checks, discusses the value-added merits of mixed-signal IC checking out to a manufacturer's product, and obviously defines the function of the try out engineer.

New to This Edition
* a brand new bankruptcy on RF try out equipment and basics of RF Testing
* a brand new bankruptcy on Clock and Serial info Communications Channel Measurements
* assurance of RF load board design
* New insurance of probabilistic reasoning for mixed-signal trying out

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Additional info for An Introduction to Mixed-Signal IC Test and Measurement

Example text

During the first phase of the measurement, a hardware sampleand-hold circuit samples a voltage. This first reference voltage is then subtracted from a second voltage (near the first voltage) using an amplifier-based subtractor. 2. General-purpose DC multimeter. 1 A single-ended DC voltmeter has a resolution of 12 bits. It also features a sample-and-difference front-end circuit. We wish to use this meter to measure the differential offset voltage of a DUT’s output buffer. 35 V ± 10 mV, and the differential offset is specified to be ±5 mV.

The test requirements for these various devices are very different from one another. 2 may require a phase trajectory error test or an error vector magnitude test. Dedicated bench instruments can be purchased that are specifically designed to measure these application-specific parameters. It would be possible to install one of these stand-alone boxes into the tester and communicate with it through an IEEE-488 GPIB bus. However, if every type of DUT required two or three specialized pieces of bolt-on hardware, the tester would soon resemble Frankenstein’s monster and would be prohibitively expensive.

A second design pass is often required to correct errors and to align the actual circuit performance with specification requirements. Finally, the corrected design is released to production by the product engineer, who then supports the day-to-day manufacturing of the new product. Of course, the idealized concurrent engineering flow is a simplification of what happens in a typical company doing business in the real world. Concurrent engineering is based on the assumption that adequate personnel and other resources are available to write test plans and generate test hardware and software before the first silicon wafers arrive.

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